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Note Note

To use ULINKplus, MDK v5.25 or higher is rquired

ULINKplus combines isolated debug connection, power measurement, and I/O for test automation. It gives you visibility to function, timing, and power consumption of your embedded application.

ULINKplus is easy to use and connects to Arm Cortex-based devices. It supports all classic debug features, SWV trace, and even multi-core debugging.

Together with Arm Keil MDK, you can use Event Recorder and Event Statistics to profile your application for timing and energy consumption. The System Analyzer shows the correlation of software execution with power consumption and helps you to optimize the energy profile of your embedded system.

Case Study: Energy optimization of a battery-powered device

Learn how we used ULINKplus to analyze a battery-powered Bluetooth Low Energy (BLE) beacon and to optimize hardware and software. The battery life improved from original 358 days to 863 days.

ULINKplus Quick Start

Debug and trace


Power measurement


Test automation


Power measurement

ULINKplus Power Measurement

ULINKplus provides isolated JTAG/serial-wire and isolated power measurement connections to the target hardware. This is essential for testing applications such as motor control, power converters, or systems with sensitive analog processing. The power measurement is synchronized to event tracing which makes it easy to optimize the energy efficiency of a system. The intuitive graphical user interface allows you to quickly spot and attribute any unintended behavior to the right piece of code.

Note Note

For more information, watch our introduction videos available on the Quick Start page.

Power profiling with Event Statistics

The Event Statistics feature in the Event Recorder enables developers to easily collect and analyze statistical data when executing their application code. The available metrics cover execution time, counts, as well as energy consumption data collected with ULINKplus.


I/Os for test automation

The integrated I/Os of ULINKplus are accessible from debug views or from debug scripts to interact with the target under test or to control automated test stands.

You can easily configure the I/Os in the µVision debugger. Simply select the pin function (digital/analog and input/output). The values that are applied to the pins are automatically updated and displayed.

A template debug script helps you to get started creating your own test automation scripts. This template:

  • includes a Configuration Wizard script to manually configure the IO pins.
  • includes debug functions that create digital signals and analog voltage patterns.
  • creates a toolbox for easy test execution from the debugger.
ULINKplus I/O Configuration


This table provides the basic technical specifications of ULINKplus. For more information, please refer to the ULINKplus User's Guide.

Interface Description
USB USB 2.0 high-speed
Provides power supply for ULINKplus
JTAG/SWD Voltage range: 1.2 V .. 5.5 V
Clock speed: configurable up to 10 MHz
SWO trace capturing: data rate up to 50 Mbit/s (UART/NRZ Mode)
Isolation: 1 kV
Supports hot-plugging to a running target
Power Sample rate: 20 MHz (16-bit delta-sigma technology)
Input voltage range: +/- 6.0 V
  - Precision: +/- 2%
  - Resolution: 0.6 mV
Input current range (with internal shunt resistor): +/- 2.5 mA
  - Precision: +/- 2%
  - Resolution: 200 nA
  Current range is extended using external shunt resistors
Isolation: 1 kV
I/O 9 configurable I/O pins support:
  - Up to 9 digital I/O pins
  - Up to 4 analog input pins (3 if analog output is required)
  - 1 analog output pin (reconfigures 1 analog input pin)
Additional +3.3 V supply voltage (10 mA) switchable
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